Acknowledgement
###############################################################

While all criticism may be directed to the project lead, `Harold W. Hatch <../../CONTACT.html>`_, acknowledgements belong to the following people listed in alphabetical order of last name.
Some commits have thanks to particular users who may have found something useful.

For `contributing <https://github.com/usnistgov/feasst/graphs/contributors>`_, testing and discussion:

* `Dr. Daniel W. Siderius <https://www.nist.gov/people/daniel-w-siderius>`_

  * :cpp:class:`HenryCoefficient <feasst::HenryCoefficient>`
  * Jacobian-Gaussian
  * :cpp:class:`TransitionMatrix <feasst::TransitionMatrix>`::reset_sweeps

* Bartosz Mazur

  * TablePotential fix https://github.com/usnistgov/feasst/pull/25
  * Run::num_trials int64 https://github.com/usnistgov/feasst/pull/31

For testing and discussion:

* Dr. Marco A. Blanco
* Dr. Alexandros Chremos
* Dr. Tamoghna Das
* Dr. Jingxiang Guo
* Steven W. Hall
* Dr. Sally Jiao
* Dr. Nathan Mahynski
* Dr. Tiara Ann Maula
* Gordon W. McCann
* Dr. Christopher Rzepa
* Samiha Sharlin
* Dr. Yingnan Wang
* Jilong Xu
* Chieh-Chih (George) Yeh
* Prof. Hasan Zerze

For discussion:

* Prof. Henry S. Ashbaugh
* Dr. Debra Audus
* Dr. Christina Bergonzo
* Dr. Cesar O Calero-Rubio
* Prof. Bin Chen
* Dr. Joseph Curtis
* Prof. Pablo Debenedetti
* Dr. Steven Howell
* Prof. Zhehui (Charlie) Jin
* Dr. William P. Krekelberg
* Prof. Jeetain Mittal
* Prof. Jeremy Palmer
* Prof. Athanassios Z. Panagiotopoulos
* Prof. Christopher J. Roberts
* Prof. Sapna Sarupria
* Dr. David A. Sheen
* Dr. Vincent K. Shen
* Prof. Thomas M. Truskett
* Prof. Norman J. Wagner

Publications
============

Publications which use FEASST include:

#. https://doi.org/10.48550/arXiv.2501.04825
#. https://doi.org/10.33011/livecoms.6.1.3289
#. https://doi.org/10.1021/acs.jpcb.5c02389
#. https://doi.org/10.1021/acs.jpcc.4c06889
#. https://doi.org/10.1021/acs.energyfuels.5c00420
#. https://doi.org/10.1021/acs.jpcb.5c00536
#. https://doi.org/10.1063/5.0224809
#. https://doi.org/10.1063/5.0224283
#. https://doi.org/10.1021/acs.jpcb.4c00753
#. https://doi.org/10.1063/5.0148488
#. https://doi.org/10.1021/acs.jpcb.3c00613
#. https://doi.org/10.1021/acs.jpcb.2c04583
#. https://doi.org/10.1002/aic.17686
#. https://doi.org/10.1080/08927022.2020.1747617
#. https://doi.org/10.1021/acs.jpca.0c05242
#. https://doi.org/10.1021/acs.jpcc.0c02671
#. https://doi.org/10.1039/C9SM01877H
#. https://doi.org/10.6028/jres.124.032
#. https://doi.org/10.1063/1.5123683
#. https://doi.org/10.1039/C9ME00006B
#. https://doi.org/10.1016/j.xphs.2018.12.013
#. https://doi.org/10.1063/1.5040252
#. https://doi.org/10.1039/C8SM00989A
#. https://doi.org/10.1063/1.5026493
#. https://doi.org/10.1063/1.5016165
#. https://doi.org/10.1039/C7SM01005B
#. https://doi.org/10.1063/1.4949758
#. https://doi.org/10.1039/C6SM00473C
#. https://doi.org/10.1063/1.4918557
#. https://doi.org/10.18434/T4M88Q
